Automated measurement system for optoelectronic devices based on National Instruments PXI-platform
Maksim E. Cherniak, Alexander A. Pechenkin, Roman K. Mozhaev, Anastasia V. Ulanova, Alexander Y. Nikiforov · 2017
The article discusses the automated system for measurement of optical and electrical parameters of optoelectronic devices such as laser diodes and photodiodes using a National Instruments PXI-platform and Ophir laser power sensors. The typical connection circuit and method of parameters control are described.