Circuit Reliability Analysis Using Signal Reliability Correlations
Jinchen Cai, Chunhong Chen · 2017
With continuous scaling of CMOS technology, reliability is becoming one of key issues for integrated circuit designs. This paper presents an effective reliability analysis method for combinational circuits by using signal reliability correlations. Signal probabilities in the error-free version of unreliable circuits are assumed to be available prior to using the proposed method, as they can be obtained from many standard CAD tools. Simulation results on benchmark circuits show that the proposed method outperforms many existing methods in terms of efficiency and/or accuracy levels.