A Survey of DC - Methods for Determining the Series Resistances of Bipolar Transistors including the new ΔI Sub - Method 1
Jörg Berkner · 2001
A survey of the most important DC - methods for determining the series resistances of integrated npn - bipolar transistors is presented. The principles, advantages and disadvan- tages are discussed. Some methods are compared based on measurement results. Furthermore, a new simple method for determining the collector series resistance, the ΔI Sub - method, is proposed. This method is based on the use of the substrate current, caused by the parasitic pnp - transistor, if the npn - transistor is in the state of saturation.