Probing Attacks on Integrated Circuits: Challenges and Research Opportunities
Huan‐Yu Wang, Domenic J. Forte, Mark Tehranipoor, Qihang Shi · IEEE Design and Test · 2017
As a type of invasive physical attacks, probing attacks are able to access and directly monitor security critical nets of an IC and extract sensitive information. In this paper, the authors summarize the state-of-the-art probing and anti-probing technologies and their challenges, and discuss the opportunities in the relevant research.