Easily testable carry-save multipliers with respect to path delay faults
Th. Haniotakis, Haridimos T. Vergos, Yiorgos E. Tsiatouhas, Dimitrios Nikolos, M. Nicolaidis · HAL (Le Centre pour la Communication Scientifique Directe) · 1999
In this paper we propose the design of an easily testable, with respect to path delay faults, n*m carry-save multiplier (CSM) and give a path selection method such that all the selected paths for testing are Single Path Propagating Hazard Free Robustly Testable (SPP-HFRT). Only three additional test inputs are required while the hardware overhead is very small and the delay overhead negligible.