Multiple-defect diagnosis for Logic Characterization Vehicles
Ben Niewenhuis, Soumya Mittal, R. D. Blanton · 2017
Previous work on the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) has emphasized the diagnosability properties of a specific class of regular circuits called functional unit block arrays (FUB arrays). This paper describes a multiple-defect, two-level diagnosis procedure that leverages these unique properties of the FUB array to significantly improve diagnosis. This custom diagnosis procedure is implemented and evaluated against commercial diagnosis using a simulated fault-injection experiment involving pairs of injected faults. Custom diagnosis is accurate in 98.2% of the simulations with resolution of at most five for 94.1% of the simulations, improving upon the commercial results of 70.7% accurate and 85.0% with the same level of resolution.