High-Temperature Stable Physical Unclonable Functions with Error-Free Readout Scheme Based on 28nm SG-MONOS Flash Memory for Security Applications
Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Takahiro Shimoi, Akihiko Kanda, Takashi Ito, Takashi Kono · 2017
Highly reliable physical unclonable functions (PUFs) based on 28-nm split-gate MONOS (SG-MONOS) embedded flash memory is developed for hardware security applications. In this paper, we investigate wide range tolerance on applied voltage, temperature and aging influence for basic PUF characteristics utilizing SG-MONOS initial Vt variation. High-temperature stable PUF at the junction temperature (Tj) of 170 deg.C can be confirmed by applying widely used automotive quality SG-MONOS flash memory. In addition, newly implemented offset read scheme achieves 0% error rate for PUF reliability without ECC.