Post-silicon observability enhancement with topology based trace signal selection
Bınod Kumar, Ankit Jindal, Masahiro Fujita, Virendra Pal Singh · 2017
Selection of trace signals for an effective post-silicon validation and debug process is a challenging problem. State restoration has been widely used as a metric for the identification of trace signals. This paper presents a topology based methodology for selecting trace signals such that the error detection latency is minimized. The proposed methodology assists in selecting trace signals capable of detecting more errors as compared to restorability based signal selection techniques.