An Analysis and Application of Pseudo-Kossel Patterns
Yasushi IKAI, Hisanobu Tokuno · Journal of the Japan Institute of Metals and Materials · 1977
X-ray pseudo-Kossel patterns, which are certain diffraction patterns obtained from irradiating divergent characteristic X-rays to a single crystal plate, are analyzed and represented in a few expressions.After Imura who was the first to analyze these patterns in a complicated equation, only two points of each pattern have been adopted in some experimental analysis.In this paper new simple sinusoidal equations of a pseudo-Kossel pattern are expressed in correspondance to the film with diffracting points on th specimen surface. Every part of the diffracted pattern as well as every point of the specimen surface can be available for analytical purposes. As an example, the equations of pseudo-Kossel patterns are applied to determine the lattice constant of pure aluminium and the sensitivity of each variable is examined.