Heavy Ion and Proton Test Results for Micron 4 Gb NAND Flash Memory
James S. Hack, Kodie Altvater, Deas Brown, Paul Dudek, Douglas Jaeger, E. Lane, John Lindley, Brainton Song, Thomas Tittel · 2016
This paper describes the methodology and test results from heavy ion and proton testing of the Micron 4 Gb NAND flash memory, with particular attention to characterization of the transient high current effect previously observed.