Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces
Christian Gleichner, H.T. Vierhaus · Journal of Circuits Systems and Computers · 2017
In state-of-the-art automotive controllers, functional tests are used to check their integrity in the field. Features dedicated to production test of integrated circuits such as scan chains are not applied in the embedded system. However, such test structures enable a more effective and diagnostic test, which improves the fault analysis in case of a system failure and even increases system reliability. To achieve this, an access to the integrated test logic is required. This paper describes a concept of a test access to embedded systems via high-speed standard interfaces. The extended test logic as well as an appropriate test routine is presented.