Testing Memory Management Units
Jeffrey Hamilton, Ramachandra P. Kunda, Bharat Deep Rathi · Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign) · 1988
many of the processor subsystem functions.The MMU is a multi-chip level-sensitive scan-design (LSSD) that does not support special testing hardware.Scan-based test methods could not be used for this design, because LSSD rules were only followed at the chip level.The functional diagnostics approach suggested in this paper uses the system's instruction set to diagnose the MMU.This method uses a "divide-andconquer" approach to reduce the testing complexity.An added advantage of this approach is that the same diagnostics have been used for MMU debug, system integration and system qualification.During this pro cess we have detected design errors, permanent faults, and even the known timing problems in the logic.