Oscillation-based test in a CCII-based bandpass filter
Pablo Petrashin, Luis Toledo, Walter Jose Lancioni, Piotr Jan Osuch, Tinus Stander · 2017
Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first time. Adopting a CCII-based band pass filter as a case study, it is shown that OBT can be implemented with a minimally intrusive switched feedback loop to establish the oscillator. Exhaustive fault simulation indicates 98.11% detection of possible short circuit and 100% detection of possible open circuit faults in the circuit under test, in both 0.35μm and 1.2μm CMOS technology nodes.