A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip Networks
Biswajit R. Bhowmik, Santosh Biswas, Jatindra Kumar Deka · 2016
This paper proposes a cluster-based, distributed scheme for on-line testing of short faults in NoC interconnects. Proposed scheme detects both intra-and inter-interconnect short faults and identifies faulty interconnect-wires at a node. Then nodes are scheduled such that the proposed scheme offers comparative lower test time. We further see that the proposed scheduling suggests same time for larger NoCs irrespective of size and topology. Proposed distributed scheme therefore decomposes a NoC architecture into instances, and further into clusters to improve the test parallelism, which is one of the most important performance factors for large scale NoCs. The scheme is strictly evaluated in a set of NoCs with fault injection campaign. The experimental results show a significant reduction on packet latency and energy consumption.