Functional and circuitry base of control equipment designed for testing large-scale integrated circuits
Alexander V. Nikonov, Galina V. Nikonova · 2016
The paper investigates functional and circuitry base used in the development of instrumentation for testing large-scale integrated circuits. Methods for achieving resolution of less than 100 ps with an error of not higher than 10-20 ps are observed. The paper analyses methods of time delay, which can be used for creating digital devices of picosecond range for UHF signals and gives the structure of high-precision digital delay line for UHF range, operating in the 15 ns interval and having the error of not more than 20 ps.