Analog fault coverage improvement using final-test dynamic part average testing
Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges E. Gielen · 2016
The growing number of chips in automotive applications has created an increasing urge to avoid electronic failures in the field. Part Average Testing (PAT) is a generally used technique to screen out early-life failures for automotive products. In this paper we demonstrate with industrial data the application of Dynamic Part Average Testing (DPAT) at the final testing stage in order to improve the analog fault coverage of a mixed-signal automotive product. Simulation results on an industrial circuit indicate an analog fault coverage improvement from 31.3 % to 82.7 %. This is demonstrated with experimental data.