Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation
Senling Wang, Hanan T. Al-Awadhi, Hamada Soh, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima · 2016
BIST based field testing is a promising way to guarantee the functional safety of intelligent and autonomous systems. To improve the fault coverage with less random patterns for BIST, sequentially observing some flip-flops (FFs) during multi-cycle test is useful. In this paper, we propose the methodology for selecting the Fault-Detection-Strengthened FFs in multi-cycle test by evaluating the structure of a circuit. The experimental results of ITC99 benchmarks and a real Electronic Control Unit (ECU) circuit show the effectiveness of the proposed methods in fault coverage improvement and random pattern reduction.