Fault Detection in a Two Level Negative Gate Network
A. Pal, A.K. Palit, S. Pal, M. S. Basu, Avik Kumar Choudhury · IETE Journal of Research · 1975
The paper deals with the detection of faults in a two level negative gate network realizing general Boolean functions.A mathematical approach has been formulated and an algorithm has been developed to generate test sets for faults of the “stuck-at-zero” and “stuck-at-one” type. Faults in all input lines, primary as well as functional, have been considered. The network is assumed to be presynthesized in its minimal form.The algorithm is programmable on a digital computer.