Comparison of EM Probes Using SEMA of an ECC Design
Christian Wittke, Zoya Dyka, Peter Langendöerfer · 2016
Analyzing of electromagnetic traces is an effective side channel analysis attack but its success and real effort are highly related to the electromagnetic probe used for measuring. In this paper we attack our design for elliptic curve point multiplication using simple electromagnetic analysis. We discuss the theoretical basis of measuring electromagnetic radiation and show how the electromagnetic probe and its orientation are influencing the measured traces. We are presenting traces measured using 7 different probes under the same conditions, i.e. the same design processing the same inputs, to demonstrate this influence and to show that not only the cryptographic chip but the whole printed circuit board needs to be protected against electromagnetic analysis attacks.