Method of normalization of the contour line in thickness based on binary masks
A. G. Shauchuk, Viktar Yu. Tsviatkou · 2016
In this paper propose a method of normalization in thickness of the contour lines based on the analysis by mask of the local orientations of fragments. Comparison of the proposed method with known methods of thinning is held. It is shown that the proposed method is superior to the known methods of thinning on speed and quality.