Segmented scan architecture using segment grouping for test cost reduction
Myung-Hoon Yang, Taejin Kim, Yongjoon Kim, Sungho Kang · 2008
This paper presents a segmented scan architecture to reduce both test application time and test power consumption. The proposed scan architecture partitions scan chains into several segments and groups these segments into several compatible segment groups. All segments within each compatible segment group are filled with test vector data in parallel. Since scan shift operations are limited to segments, the test application time and test power can be significantly reduced.