Forensic characterization of RF devices
Aravind K. Mikkilineni, Deen King-Smith, Saul B. Gelfand, Edward J. Delp · 2009
We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices. Probe signals, device models, feature selection and classifier design are described, and experimental results are given to verify our approach.