Built In Self Test (BIST) Survey - an industry snapshot of HVM component BIST usage at board and system test
Zoe F. Conroy, Hui Li, Jun Balangue · 2010
With board and component technology and integration rapidly increasing and becoming more complex, the testing of boards standalone and in a system is becoming more difficult, time consuming and costly. This paper addresses integrated circuit (IC) Built In Self Test (BIST) usage at the board and system test levels to provide increased test coverage, reduced test time and cost. This paper presents the results of an IC BIST usage survey developed by the International Electronics Manufacturing Initiative (iNEMI). The survey was intended to gauge the current adoption rate of IC BIST for board and system test, identify any impediments to widespread use, and select areas for future research.