Enable Robustness of Data System for Intel Assembly/Test Manufacturing Factories with High Degree of Data Integrity
Lim Yen Lin · IEEE/CPMT International Electronics Manufacturing Technology Symposium · 2006
This paper addresses the data integrity (DI) challenges faced by Intel manufacturing. Critical data missing in fab/sort/assembly/test manufacturing has brought Intel to a risk of shipping escapees to end customers as a consequence of inaccuracy in engineering analysis. This paper will describe about the capability to eliminate the risks of data missing. The capability is an automated solution to track the test DI performance, and effectively assist the DI root-cause tracing and analysis, and finally automate the DI recovery best known methods (BKM) to ensure the robustness of overall data system for all assembly/test factories, varies geography manufacturing site across Intel worldwide.