Built-in Self Testing (BIST) of RF Performance in a System-on-Chip (SoC)
Imran Bashir, Robert Bogdan Staszewski, Oren Eytan Eliezer, E. de-Obaldia · 2006
The advantages of having an on-chip system for measuring critical RF performance parameters are endless. With this capability, millions of ICs can be tested using a low cost tester while benefiting from an increase in test coverage and a reduction in test time and cost in a production environment. Another significant benefit is in the factory calibration procedures of critical device settings before deployment. Finally, this capability can allow the wireless terminal to periodically log performance results in flash memory from which they can be retrieved during the repair of a damaged unit easing debug analysis by the manufacturer. This paper presents a novel method of executing on-chip low-cost performance and compliance testing of a local oscillator and transmitter in a wireless transceiver. The presented techniques have been implemented and successfully tested in a Texas Instruments commercial 130 nm CMOS single-chip Bluetooth radio and are being redefined for the 90nm single-chip GSM radio.