An automatic test program generator
Takuya Ogata, T. Ono, T. Watanabe, Koichi Ito · 2002
A test program generator that automatically generates test programs for LSI devices from general-purpose device test specifications is described. The AG-5 automatic test program generator consists of a hardware-independent front-end preprocessor that supports entry of device test specifications, a compiler to convert tester hardware and a reverse compiler to ensure that validated test parameter changes are reflected in the test specifications. The AG-5 program generation environment realizes large time savings by automatically generating programs in an easy-to-understand procedural language, and by ensuring that parameter changes in the test program are automatically reflected in the test specifications.>