A Configurable Test-Processor for Board-Level Testing
J.-H. Meza Escobar, Heinz‐Dietrich Wuttke, Steffen Ostendorff · 2016
The ROBSY approach is able to autonomously generate highly flexible FPGA-based test instruments for structural testing of printed circuit boards (PCBs). This paper deals with the development of an essential part of ROBSY: the test-processor. It is specialized for board-level testing and includes configuration parameters for the adaptation to the specific test case. The level of adaptation is essential for ROBSY and is not presented in other test-processors found in the literature. In order to evaluate the viability of ROBSY, the ROBSY test system was used to test the interconnections to an SRAM device. The experiments demonstrate that the ROBSY approach and test-processor are suitable for board-level testing.