Non-intrusive built-in self-test for FPGA and MCM applications
Andrew D. Russ, Charles E. Stroud · 2002
Built-In Self-Test (BIST) techniques which are non-intrusive to the circuitry under test are investigated for incorporation in Field Programmable Gate Arrays (FPGAs) and Multi-Chip Modules (MCMs). The purpose is to test and diagnose circuitry external to the FPGAs or the various VLSI devices on MCMs during off-line system level testing. These approaches incur no area or performance penalties yet diagnostic resolution can be obtained to the device level. Design guidelines are developed to assist in the effective application and implementation of these techniques.