Sequential circuit testing
Samiha Mourad · 2002
After a brief recap of problem areas in sequential circuit testing different approaches to testing sequential circuits are reviewed. Both synchronous and asynchronous circuits are considered. Examples are given from the following areas: (1) functional techniques, such as the checking experiment, and its extension to built-in self-test (BIST) testing and to logic synthesis; (2) heuristic techniques, such as iterative test pattern generation; (3) scan-path techniques, and (4) alternatives to scan path.>