A Method for On-Wafer S-Parameter Measurement of a Differential Amplifier by Using Two-Port Network Analyzer
Ling Sun, Zhigong Wang, Jianjun Gao · 2006
By analyzing the relationship of S-parameter between two-port differential and four-port single-ended networks, a method is found for measuring the S-parameter of a differential amplifier on wafer by using a normal two-port vector network analyzer. With this method, it should not especially purchase a four-port vector network analyzer. Furthermore, the method was also suitable for measuring S-parameter of any multi-port circuit by using two-ports measurement set.