Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)
Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Bover, B. Vrignon, John A. Shepherd, Thanh‐Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise Ribotta · 2014
Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.