LFSR Polynomial and Seed Selection Using Genetic Algorithm
E. Aleksejev, Artur Jutman, Raimund Ubar · Proceedings of the ... biennial Baltic Electronics Conference · 2006
In this paper the authors present a framework aimed at optimization of important properties of pseudo-random test pattern generators used in embedded testing of modern complex digital devices like systems-on-chip. The method we propose is based on an evolutionary technique often referred as the genetic algorithm. Experimental results show the feasibility of the proposed method