On-chip microwave test circuits for production IC measurements
William R. Eisenstadt, Robert M. Fox, Qizhang Yin, Jangsup Yoon, Tao Zhang · 2006
The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).