Tagged probabilistic simulation provides accurate and efficient power estimates at gate level
Chih-Shun Ding, Massoud Pedram · 2002
In this paper we summarize the techniques employed in tagged probabilistic simulation (TPS) to perform gate level power estimation. A prominent feature of TPS is the use of tagged probability waveforms to provide a more compact, yet detailed, waveform representation. This helps resolve several important shortcomings of conventional probabilistic simulation techniques in which the logical waveforms of each node are represented by a single probability waveform. Experimental results show that TPS can provide accuracy levels of 10-15% compared to circuit simulation in dynamic power estimation with run times orders of magnitude faster.