Equivalence fault collapsing for transistor leakage faults
Wen Xiaoqing, Kewal K. Saluja, K. Kinoshita, Hideo Tamamoto · 2002
This paper presents an innovative method of equivalence fault collapsing for the transistor leakage faults, a fault model often used in I/sub DDQ/ testing. The experimental results show the effectiveness of the proposed method in reducing the number of faults that have to be considered and its usefulness in I/sub DDQ/ testing.