CIEARER Eer FIA W IMAGE UTILIZING er INVERSION TECHNIQUE
Hiroshi Hoshikawa, Kiyoshi Koyama · 1997
Eddy current imaging has been used in eddy current nondestructive testing in order to identify small surface flaws in conducting materials [1-5]. However, the conventional pancake coil probes provide blurred flaw images because the eddy current in the test material induced by the probe spreads over a larger area than the coil size. The authors first applied popular