A fast test pattern generation for large scale circuits
Yusuke Matsunaga, Masahiro Fujita · 1993
This paper describes a fast test pattern generator for large combinational circuit. Refining existing algorithms, the system can detect testable faults and identify redundant faults more effectively and more efficiently. Three major contributions are presented in the paper, which are a fast algorithm finding path controllers, circuit narrowing technique and global implication based on equivalence. These modifications are described in detail and experimental results using ISCAS benchmark circuits are shown