Software for embedded systems
Nuno Pedro Silva, Marco Paulo Amorim Vieira · 2016
Failures in critical embedded systems can lead to severe human, mission or economic consequences. Besides the strict requirements of these systems there are still a high number of issues creeping through the development and Verification & Validation phases. Common techniques, such as Independent Software Verification and Validation, represent a valuable asset to uncover those issues, but a proper and efficient issue classification system is necessary to analyze the root causes, identify the development processes to improve, and assess the efficiency of verification activities. Orthogonal Defect Classification (ODC), the most commonly used and adopted classification scheme, has not been originally targeted to critical systems engineering issues, thus we propose an adaptation of ODC to promote an orthogonal classification of defects in critical systems in an efficient way. This paper introduces the classification process, the proposed adaptations to the ODC taxonomy, and the results of applying the adapted taxonomy to a real dataset.