Test strategy for a 32-bit microprocessor module with memory management unit
R. Balasubramaniam, Peretz M. Feder · International Test Conference · 1984
The WE- 32002 VLSI microprocessor module with Memory Management unit, containing high circuit density and a large I/O pin count, has been successfully tested at full speed using a high-speed Takeda Riken T-3340 test system with 256 pins. Synchronization of the microprocessor with the test system and high-resolution diagnostic and certification test requirements imposed constraints upon this testing. This paper describes the testing strategies adopted to overcome these constraints.