TEST FREQUENCY SELECTION IN ANALOG FAULT DIAGNOSIS. PART II: RESULTS
Constantin Viorel Marin, Doina Marin · 2008
Modern analog circuit development has as result many new analog electronic circuits with not only greater complexity but also with circuit elements being inaccessibly embedded within circuit chips. Consequently, there is a great interest in systematic fault diagnosis and isolation techniques for analog circuits where direct access to the individual circuit elements is no longer needed. In the first part of this paper [1], various approaches to the analog fault diagnosis as well as its theoretical background are presented. Testability and groups of ambiguity [2-10], fundamental concepts in analog fault diagnosis, are emphasized. The main steps of the algorithm to solve a problem of analog fault diagnosis in SAT (simulation after test) approach are analyzed. The proposed test frequency selection algorithm and an exemplifying problem are described. In the second part of this paper, there will be presented the simulation results, their analysis and the conclusions concerning the proposed method for frequency test selection.