On New Test Points for Compact Cell-Aware Tests
Cesar Acero, D.B.I. Feltham, Marek J. Patyra, Friedrich Hapke, Elham Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada · IEEE Design and Test · 2016
Test points are known to improve the fault coverage in BIST applications. This article discusses a new class of test points used to improve the ATPG pattern count in designs that employ embedded deterministic test.