-Based Generation of Partially-Functional Broadside Tests
Irith Pomeranz · IEEE Transactions on Computers · 2015
This paper describes a procedure that computes seeds for$LFSR$-based generation of partially-functional broadside tests. Existing$LFSR$-based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed$s_i$in order to reduce the Hamming distance between the scan-in state$p_i$that$s_i$creates and a reachable state$r_j$. When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage.