Position Statement: The DFT Trip -- Dad Are We There Yet?
Alfred L. Crouch · International Test Conference · 2001
When I started as a design-for-test (DFT) engineer many, many, many, years ago, I had to crawl through schematics and find places to insert controllability and observability into systems, boards, and chips to make them more testable. Latchback, Testpoint Insertion, and SCOAP analysis were fundamental weapons in the test war. The goal was to place hooks in the design to help with debug and diagnostics and to meet customer defined quality levels. As a matter of fact, there was more emphasis in being able to detect and isolate to the failed element after the system was put in use, than using the DFT to assist with production test.