Efficient selection of critical paths for delay defects in the presence of process variations
Phaninder Alladi, Spyros Tragoudas · 2016
This paper presents a method to select critical paths that target spot delay defects in the presence of process variations. The number of critical paths |C| selected are restricted to a test budget. The method uses heuristics that quickly identify the most critical path based on dynamic programming approach. The method considers the established linear parameterized model where gate delays are probability density functions. Experimental results on publicly available benchmarks demonstrate the efficiency of the approach.