Thermal characterization of capacitors
Zoltán Sárkány, Gábor Farkas, M. Rencz · 2016
The elevated temperature has negative effect not only on semiconductor components, but on discrete capacitors as well. Both the electric parameters and the lifetime can be significantly affected by the temperature. In this paper a new measurement setup is presented that enables the widely used thermal transient characterization method to be used also for the discrete capacitors. This measurement method enables the measurement of the thermal impedance of the capacitor devices allowing to construct dynamic thermal models based on measured results. Finally the capabilities of the measurement approach are demonstrated with two application examples.