Infant mortality tests for analog and mixed-signal circuits
Suvadeep Banerjee, Suriyaprakash Natarajan · 2016
A new methodology for extracting compact test stimuli from functional tests for infant mortality testing of analog circuits is proposed. The test stimuli are extracted such that they produce extremal electrical activity in the circuit to push latent defects over the edge to become hard defects. Results on analog modules from the receiver sub-system of a high speed serial interface show that tests that are about 1/5th the size of the original functional test can be extracted while achieving consistently at least 80% of the electrical activity of the functional test.