A New Dictionary Mechanism for Efficient Fault Diagnosis
Sang-Wook Kim, Yongjoon Kim, Chun Sung-Hoon, Sungho Kang · Journal of the Institute of Electronics Engineers of Korea · 2006
In this paper, a fault dictionary for fault locations is considered. The foremost problem in fault diagnosis is the size of the data. As circuits are large, the data for fault diagnosis increase to the point where they are impossible to be stored. The increased information makes it impossible to store the dictionary into storage media. In order to generate the dictionary, j.e. pass-fail dictionary some dictionaries store a portion of the information. The deleted data makes it difficult to diagnose fault models except single stuck-at fault. This paper proposes a new dictionary format. A new format makes a dictionary small size without deleting any informations.