Distributed Test Method using Logical Clock
Youngjoon Choi, Myeong-Chul Kim, Soonuk Seol · Jeongbo gwahaghoe nonmunji. si'seu'tem mich i'lon · 2001
It is difficult to test a distributed system because of the task of controlling concurrent events,. Existing works do not propose the test sequence generation algorithm in a formal way and the amount of message is large due to synchronization. In this paper, we propose a formal test sequence generation algorithm using logical clock to control concurrent events. It can solve the control-observation problem and makes the test results reproducible. It also provides a generic solution such that the algorithm can be used for any possible communication paradigm. In distributed test, the number of channels among the testers increases non-linearly with the number of distributed objects. We propose a new remote test architecture for solving this problem. SDL Tool is used to verify the correctness of the proposed algorithm and it is applied to the message exchange for the establishment of Q.2971 point-to-multipoint call/connection as a case study.