An Efficient BIST for Mixed Signal Circuits
Geum-Hwan Bang, Seong-Ho Gang · Journal of the Institute of Electronics Engineers of Korea · 2002
For mixed signal circuits that integrate both analog and digital blocks onto the same chip, testing the mixed circuits has become the bottleneck. Since most of mixed signal circuits are functionally tested, mixed signal testing needs expensive automatic test equipments for test input generation and response acquisition. In this paper, a new efficient BIST is developed which can be used for mixed signal circuits. In the new BIST, only faults on embedded resistances, capacitances and its combinations are considered. To guarantee the quality of chips, the new BIST performs both voltage testing and phase testing. Using these two testing modes, all the faults are detected. In order to support this technique, the voltage detector and the phase detector are developed. Experimental results prove the efficiency of the new BIST