Efficient AMBA Based System-on-a-chip Core Test With IEEE 1500 Wrapper
Hyunbean Yi, Juhee Han, Byeongjin Kim, Sungju Park · Journal of the Institute of Electronics Engineers of Korea · 2008
This paper introduces an embedded core test wrapper for AMBA based System-on-Chip(SoC) test. The proposed test wrapper is compatible with IEEE 1500 and can be controlled by ARM Test Interface Controller(TIC). We use IEEE 1500 wrapper boundary registers as temporal registers to load test results as well as test patterns and apply a modified scan test procedure. Test time is reduced by simultaneously performing primary input insertion and primary output observation as well as scan-in and scan-out.